Dr. Frank Holzer

Contact / Addess:

E-mail

Phone: +49 (0) 341 6025 1358

Helmholtz-Centre for Environmental Research - UFZ
Department Technical Biogeochemistry
Permoserstrasse 15
04318 Leipzig, Germany

Dr. John Dow

About Frank Holzer

Frank Holzer received his PhD in 2003 in Engineering from the Martin-Luther-University Halle-Wittenberg. He did his research from 2004 to 2006 at the Florida State University in the USA in the field of contaminant removal from industrial waste water by nonthermal plasmas. Since 2006 he has been working as a scientific coworker in different projects at the UFZ and the University of Applied Sciences (HTWK) Leipzig with the focus on radiowave technology and plasma application. He is part of the Applied Environmental Physics group.


2018 - current Scientist in the Dpt. Technical Biogeochemistry at the UFZ and at the HTWK (Faculty of Engineering and Centre for Mathematics and Natural Sciences
2009 - 2018 Scientist at the UFZ, Dpt. Environmental engineering
2007 - 2009 Postdoc at the HTWK Leipzig, Faculty of Civil Engineering
2005 - 2007 Postdoc at Florida State University, , Tallahassee, USA, Dept. of Chemical and Biomedical Engineering
2003 - 2004 Scientific assiciate at the University of Applied Sciences (HTWK) Leipzig
2003 PhD in Engineering, Martin-Luther-University Halle-Wittenberg, Thesis title: "Oxidation of organic compounds by applying porous and non-porous solids in a non-thermal plasma"
2003 Specialist engineer in Analytics and Spectroscopy
2001 - 2003 Postgraduate studies "Analytics and Spectroscopy" at the University of Leipzig as part of a qualification program funded by the European Social Fund (ESF)
1997 - 2000
Fellowship of Deutsche Bundesstiftung Umwelt, PhD student at UFZ
1997 Diploma in Engineering at the Technical University Dresden, Germany

Nonthermal plasmas

  • Gas phase plasmas and plasmas in contact with aqueous media
  • plasma application for contaminant removal or synthesis of compounds
  • combination of heterogenous catalysts and nonthermal plasmas


Radiowave technology

  • Simulation of electromagnetic fields and power loss densities in dielectric materials
  • Design and construction of electrode geometries for dielectic heating of solids
  • Application of radiowave technology on field sites


Physical and chemical analysis methods

  • Gaschromatography in combination with various detectors (MS, FID, WLD)
  • FTIR spectroscopy using diffusive reflectance (DRIFT) or attenuated total reflection (ATR)
  • UV/VIS adsorption and emissions spectroscopy
  • Spacially resolved temperature measurment along optical quarz fibres by evaluating Rayleigh- and Raman scattering
  • Impedance spectroscopy

Publications

Index:

You could use our publication index for further requests.

2024 (1)

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2023 (2)

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2022 (1)

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2019 (1)

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2018 (6)

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2016 (2)

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2014 (2)

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2013 (5)

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2012 (4)

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2011 (11)

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2010 (4)

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2009 (2)

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2008 (5)

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2007 (4)

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2005 (4)

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2004 (1)

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2003 (3)

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2002 (2)

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2001 (2)

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2000 (1)

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Publications before joining UFZ

  • M. Schmidt, P.J. Janse van Rensburg, W.E. Meyer and F.D. Auret,
    Observation of low-temperature annealing of a primary defect in gallium nitride,
    Physica B 439 64 (2014)
    DOI: 10.1016/j.physb.2013.11.008

  • M. Schmidt, H. de Meyer, P.J. Janse van Rensburg, W.E. Meyer and F.D. Auret,
    Introduction and annealing of primary defects in proton-bombarded n-GaN,
    Phys. Status Solidi B 251, 211 (2014)
    DOI: 10.1002/pssb.201349191

  • W. Mtangi, M. Schmidt, F.D. Auret, W.E. Meyer, P.J. Janse van Rensburg, M. Diale, J.M. Nel, A.G.M. Das, F.C.C. Ling and A. Chawanda,
    A study of the T2 defect and the emission properties of the E3 deep level in annealed melt grown ZnO single crystals,
    J. Appl. Phys. 113, 124502 (2013)
    DOI: 10.1063/1.4796139

  • M. Schmidt, H. v. Wenckstern, R. Pickenhain and M. Grundmann,
    On the investigation of electronic defect states in ZnO thin films by space charge spectroscopy with optical excitation
    Solid-State Electron. 75, 48 (2012)
    DOI: 10.1016/j.sse.2012.04.043

  • M. Schmidt, M. Ellguth, R. Karsthof, H. v. Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, and F.C.C. Ling,
    On the T2 trap in zinc oxide thin films,
    Phys. Status Solidi B 249, 588 (2012)
    DOI: 10.1002/pssb.201147271

  • M. Schmidt, K. Brachwitz, F. Schmidt, M. Ellguth, H. v. Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, and W. Skorupa,
    Nickel-related defects in ZnO – A deep-level transient spectroscopy and photo-capacitance study,
    Phys. Status Solidi B 248, 1949 (2011)
    DOI: 10.1002/pssb.201046634

  • Z. Zhang, H. v. Wenckstern, M. Schmidt, and M. Grundmann,
    Wavelength selective metal-semiconductor-metal photodetectors based on (Mg,Zn)O-heterostructures,
    Appl. Phys. Lett. 99 083502 (2011)
    DOI: 10.1063/1.3628338

  • A. Lajn, M. Schmidt, H. v. Wenckstern,and M. Grundmann,
    Transparent rectifying contacts for visible-blind ultraviolet photo diodes based on ZnO,
    J. Electr. Mat. 40, 473 (2011)
    DOI: 10.1007/s11664-010-1395-x

  • M. Ellguth, M. Schmidt, H. v. Wenckstern, R. Pickenhain, and M. Grundmann,
    Characterization of point defects in ZnO thin films by optical deep level transient spectroscopy,
    Phys. Status Solidi B 248, 941 (2011)
    DOI: 10.1002/pssb.201046244

  • H. v. Wenckstern, K. Brachwitz, M. Schmidt, C.P. Dietrich, M. Ellguth, M. Stölzel, M. Lorenz and M. Grundmann,
    The E3 defect in MgZnO,
    J. Electr. Mat. 39, 584 (2010)
    DOI: 10.1007/s11664-009-0967-0

  • J. Chai, R.J. Mendelsberg, R.J. Reeves, J. Kennedy, H. v. Wenckstern, M. Schmidt, M. Grundmann, K. Doyle, T.H. Myers, and S.M. Durbin,
    Identification of a Deep Acceptor Level in ZnO due to Silver Doping,
    J. Electr. Mat. 39, 577 (2010)
    DOI: 10.1007/s11664-009-1025-7

  • M. Schmidt, M. Ellguth, F. Schmidt, T. Lüder, H. v. Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, and W. Skorupa,
    Defects in a nitrogen-implanted ZnO thin film,
    Phys. Status Solidi B 247, 1220 (2010)
    DOI: 10.1002/pssb.200945534

  • M. Schmidt, M. Ellguth, C. Czekalla, H. v. Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, W. Skorupa, M. Helm, Q. Gu, and F.C.C. Ling,
    Defects in zinc-implanted ZnO thin films,
    J. Vac. Sci. Technol., B 27 1597, (2009)
    DOI: 10.1116/1.3086659

  • M. Schmidt, R. Pickenhain, and M. Grundmann,
    Exact solutions for the capacitance of space charge regions at semiconductor interfaces,
    Solid-State Electron. 51, 1002 (2007)
    DOI: 10.1016/j.sse.2007.04.004

Theses

Ph.D thesis (Universität Leipzig, 2012):

Space-Charge Spectroscopy applied to Defect Studies in Ion-Implanted Zinc Oxide Thin Films


Diploma thesis (Universität Leipzig, 2006):

Theoretische Untersuchungen zu Raumladungszonen an Halbleitergrenzflächen
(Theoretical Investigations of Space-Charge Regions at Semiconductor Interfaces)