Publication Details

Category Text Publication
Reference Category Book chapters
DOI 10.1109/I2MTC62753.2025.11078949
Title (Primary) Development of a methodology for monitoring of key parameters for the early assessment of water quality in reservoirs
Title (Secondary) 2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Chemnitz, Germany, 19-22 May 2025
Author Penzel, S.; Rudolph, M.; Borsdorf, H. ORCID logo ; Kanoun, O.
Source Titel IEEE International Instrumentation and Measurement Technology Conference
Year 2025
Department MET
Page From 1
Page To 5
Language englisch
Topic T5 Future Landscapes
Keywords water monitoring; reservoirs; in-situ system; UV/Vis and fluorescence spectroscopy; fuzzy classification
Abstract Reservoir water quality is critical to ecosystem health, human well-being and effective water resource management. In view of global challenges such as climate change, industrial pollution and agricultural runoff, this study developed a robust methodology for real-time water quality monitoring. Advanced UV/Vis and fluorescence spectroscopy was used to measure key parameters, including fluorescent dissolved organic matter (FDOM) and chemical oxygen demand (COD). The data pre-processing, feature extraction and fuzzy classification techniques outlined in this paper can be employed to identify contamination parameters, thereby enhancing the precision of predictions and integrating on-site measurement uncertainties. The results of this study demonstrate the potential to detect water quality problems at an early stage and to provide a dynamic and accurate understanding of reservoir conditions through real-time analyses.
Persistent UFZ Identifier https://www.ufz.de/index.php?en=20939&ufzPublicationIdentifier=31996
Penzel, S., Rudolph, M., Borsdorf, H., Kanoun, O. (2025):
Development of a methodology for monitoring of key parameters for the early assessment of water quality in reservoirs
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Chemnitz, Germany, 19-22 May 2025
IEEE International Instrumentation and Measurement Technology Conference
Institute of Electrical and Electronics Engineers (IEEE), New York, NY, p. 1 - 5 10.1109/I2MTC62753.2025.11078949