Publication Details |
| Category | Text Publication |
| Reference Category | Book chapters |
| DOI | 10.1109/IGARSS53475.2024.10642481 |
| Title (Primary) | Automated gross primary production application for monitoring ecosystem health within GEOSS |
| Title (Secondary) | 2024 IEEE International Geoscience and Remote Sensing Symposium, Athens, Greece, 07-12 July 2024 |
| Author | Spinosa, A.; Eleveld, M.; Mallast, U.; Peterseil, J.; Mobilia, V.; Karisma, K.; Fuentes-Monjaraz, M.A.; El Serafy, G. |
| Source Titel | International Geoscience and Remote Sensing Symposium |
| Year | 2024 |
| Department | MET |
| Volume | IGARSS 2024 |
| Page From | 4544 |
| Page To | 4547 |
| Language | englisch |
| Topic | T5 Future Landscapes |
| Abstract | This study addresses the challenges posed by climatic changes and biodiversity loss to ecosystem stability, by quantifying gross primary production (GPP) changes. An improved earth observation product is obtained by integrating in-situ and remote sensing data via data-driven models. Employing a user-centered strategy, our methodology builds on users’ engagement, ensuring both the identification of user needs and practical product demonstrations. With GEOSS as central and integrated stakeholder, we strive for a broad interoperability and accessibility of generated outcomes. The project outcomes include a curated dataset with FAIR metadata, openly available code, and reports for reproducibility, contributing to the broader Earth Intelligence supply chain. |
| Persistent UFZ Identifier | https://www.ufz.de/index.php?en=20939&ufzPublicationIdentifier=30308 |
| Spinosa, A., Eleveld, M., Mallast, U., Peterseil, J., Mobilia, V., Karisma, K., Fuentes-Monjaraz, M.A., El Serafy, G. (2024): Automated gross primary production application for monitoring ecosystem health within GEOSS 2024 IEEE International Geoscience and Remote Sensing Symposium, Athens, Greece, 07-12 July 2024 International Geoscience and Remote Sensing Symposium IGARSS 2024 Institute of Electrical and Electronics Engineers (IEEE), New York, NY, p. 4544 - 4547 10.1109/IGARSS53475.2024.10642481 |
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