Correlia is an open-source ImageJ/FIJI plug-in for the registration of 2D multi-modal microscopy data-sets. The software is developed at ProVIS - Centre for Correlative Microscopy and is specifically designed for the needs of chemical microscopy involving various micrographs as well as chemical maps at different resolutions and field-of-views.
Licensing and Download
Correlia is free software
under the GNU General Public License (GPL), version 3. It is open source and the Java code can be adapted as long as the GPL is respected. Correlia has been tested successfully on MS Windows and Linux systems. Here Correlia is made available via pre-compiled jar archive as well as source code.
Java archive (jar):
a jar archive of Correlia can be downloaded here:
- ImageJ 1.52 with bUnwarpj 2.6.12 or
- respective FIJI distribution
The installation is as easy as copying the jar-file to the plugins folder of your ImageJ/FIJI installation on your computer.
Correlia source code:
The source code will be made available via git repository soon.
- Florens Rohde, Ulf-Dietrich Braumann, and Matthias Schmidt
"Correlia: an ImageJ plug-in to co-register and visualise multi-modal correlative micrographs"
Journal of Microscopy 280 (1), 3-11 2021
- Matthias Schmidt, Florens Rohde, Ulf-Dietrich Braumann
"Visualization and co-registration of correlative microscopy data with the ImageJ plug-in Correlia"
In: T. Müller-Reichert, P. Verkade (eds.)
Correlative light and electron microscopy IV
Methods Cell Biol. 162 (2021)
Elsevier, p. 353-388
- Florens Rohde
"Entwicklung eines nichtlinearen Algorithmus zur automatischen Registrierung korrelativer Mikroskopiedaten"
(Development of a non-linear algorithm for automatic registration of correlative microscopy data-sets)
Master's Thesis (2018)
Faculty of Electrical Engineering and Information Technology, Leipzig University of Applied Sciences (HTWK Leipzig)
- Matthias Schmidt, Florens Rohde, and Ulf-Dietrich Braumann
"Correlia: An ImageJ-based Tool for the Co-registration of Multi-modal Correlative Microscopy Data."
In: Microscopy Conference 2019 (MC 2019, Abstracts), page 761, contribution LS5.005.
Deutsche Gesellschaft für Elektronenmikroskopie (DGE), September 2019.
Example 1 - Rigid registration of artificial data
Example 2 - Rigid registration of SEM-EDX data
Example 3 - Effects of Surface Roughness and Mineralogy on the Sorption of Cm(III) on Crystalline Rock